Index Terms
- VLSI Testing
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Current status and future trend on CAD tools for VLSI testing
ATS '00: Proceedings of the 9th Asian Test SymposiumFor current VLSI designs, there are two kinds of well-accepted digital testing technologies. One is for embedded memories and the other is for the logic. For embedded memories, Built-In-Self-Test (BIST) is used. For the logic, the main solutions are ...
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