- Authors:
- Manfred Dietrich,
- Joachim Haase
Uncertainty in key parameters within a chip and between different chips in the deep sub micron area plays a more and more important role. As a result, manufacturing process spreads need to be considered during the design process. Quantitative methodology is needed to ensure faultless functionality, despite existing process variations within given bounds, during product development. This book presents the technological, physical, and mathematical fundamentals for a design paradigm shift, from a deterministic process to a probability-orientated design process for microelectronic circuits. Readers will learn to evaluate the different sources of variations in the design flow in order to establish different design variants, while applying appropriate methods and tools to evaluate and optimize their design.
Cited By
Wang S, Wu F, Yang C, Zhou J, Xie C and Wan J WAS Proceedings of the 56th Annual Design Automation Conference 2019, (1-6)- Liu Y, Wei L, Zhou Z, Zhang K, Xu W and Xu Q On Code Execution Tracking via Power Side-Channel Proceedings of the 2016 ACM SIGSAC Conference on Computer and Communications Security, (1019-1031)
- Mirzaei M, Mosaffa M and Mohammadi S (2015). Variation-aware approaches with power improvement in digital circuits, Integration, the VLSI Journal, 48:C, (83-100), Online publication date: 1-Jan-2015.
- Yang M, Chang Y, Tsao C and Huang P New ERA Proceedings of the 50th Annual Design Automation Conference, (1-6)
- Laurenciu N and Cotofana S A Markovian, variation-aware circuit-level aging model Proceedings of the 2012 IEEE/ACM International Symposium on Nanoscale Architectures, (116-122)
Index Terms
- Process Variations and Probabilistic Integrated Circuit Design
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