- Authors:
- Michael Orshansky,
- Sani Nassif,
- Duane Boning
Design for Manufacturability and Statistical Design: A Comprehensive Approach presents a comprehensive overview of methods that need to be mastered in understanding state-of-the-art design for manufacturability and statistical design methodologies. Broadly, design for manufacturability is a set of techniques that attempt to fix the systematic sources of variability, such as those due to photolithography and CMP. Statistical design, on the other hand, deals with the random sources of variability. Both paradigms operate within a common framework, and their joint comprehensive treatment is one of the objectives of this book and an important differentation.
Cited By
- Maragos K, Lentaris G, Soudris D, Siozios K and Pavlidis V Application performance improvement by exploiting process variability on FPGA devices Proceedings of the Conference on Design, Automation & Test in Europe, (452-457)
Kamal M, Afzali-Kusha A, Safari S and Pedram M (2016). Yield and Speedup Improvements in Extensible Processors by Allocating Extra Cycles to Some Custom Instructions, ACM Transactions on Design Automation of Electronic Systems, 21:2, (1-25), Online publication date: 28-Jan-2016.- Zhang W, Li X, Saxena S, Strojwas A and Rutenbar R Automatic clustering of wafer spatial signatures Proceedings of the 50th Annual Design Automation Conference, (1-6)
- Yu L, Wei L, Antoniadis D, Elfadel I and Boning D Statistical modeling with the virtual source MOSFET model Proceedings of the Conference on Design, Automation and Test in Europe, (1454-1457)
- Zhang W, Singhee A, Xiong J, Habitz P, Joshi A, Visweswariah C and Sundquist J A dynamic method for efficient random mismatch characterization of standard cells Proceedings of the International Conference on Computer-Aided Design, (180-186)
- Markov I, Hu J and Kim M Progress and challenges in VLSI placement research Proceedings of the International Conference on Computer-Aided Design, (275-282)
- Gawish E, El-Kharashi M and Abu-Elyazeed M Variability-tolerant NoC link design Proceedings of the Fifth International Workshop on Network on Chip Architectures, (57-62)
- Zhang W, Balakrishnan K, Li X, Boning D and Rutenbar R Toward efficient spatial variation decomposition via sparse regression Proceedings of the International Conference on Computer-Aided Design, (162-169)
- Dyer E, Majzoobi M and Koushanfar F Hybrid modeling of non-stationary process variations Proceedings of the 48th Design Automation Conference, (194-199)
- Zhang W, Li X, Acar E, Liu F and Rutenbar R Multi-wafer virtual probe Proceedings of the International Conference on Computer-Aided Design, (47-54)
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