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Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness

Published:24 July 2016Publication History

ABSTRACT

Realistic image synthesis is an important research goal in computer graphics. One important factor to achieve this goal is a bidirectional reflectance distribution function (BRDF) that mainly governs an appearance of an object. Many BRDF models have therefore been developed. A physically-based BRDF based on microfacet theory [Cook and Torrance 1982] is widely used in many applications since it can produce highly realistic images. The microfacetbased BRDF consists of three terms; a Fresnel, a normal distribution, and a geometric functions. There are many analytical and approximate models for each of these terms.

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References

  1. Cook, R. L., and Torrance, K. E. 1982. A reflectance model for computer graphics. ACM Trans. on Graphics 1, 1, 7--24. Google ScholarGoogle ScholarDigital LibraryDigital Library
  2. Jakob, W., 2010. Mitsuba renderer. http://www.mitsuba-renderer.org.Google ScholarGoogle Scholar
  3. Walter, B., Marschner, S. R., Li, H., and Torrance, K. E. 2007. Microfacet models for refraction through rough surfaces. In Proceedings of 18th Eurographics conference on rendering techniques, 195--206. Google ScholarGoogle ScholarDigital LibraryDigital Library

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  1. Measuring microstructures using confocal laser scanning microscopy for estimating surface roughness

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    • Published in

      cover image ACM Conferences
      SIGGRAPH '16: ACM SIGGRAPH 2016 Posters
      July 2016
      170 pages
      ISBN:9781450343718
      DOI:10.1145/2945078

      Copyright © 2016 Owner/Author

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      Association for Computing Machinery

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      • Published: 24 July 2016

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