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System-level design for test of fully differential analog circuits

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Published:01 January 1995Publication History
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References

  1. 1.B. Vinnakota and R. Harjani, "The design of analog selfchecking circuits," IEEE International Conference on VLSI Design, 1994.Google ScholarGoogle Scholar
  2. 2.R. Harjani and B. Vinnakota, "Analog circuit observer blocks," in 12th IEEE VLSI Test Symposium, 1994.Google ScholarGoogle Scholar
  3. 3.M. Soma, "An experimental approach to analog fault models," in CICC, 1991.Google ScholarGoogle Scholar
  4. 4.S. W. Director, "Manufacturing-based simulation: An overview," IEEE Circuits and Devices Magazine, vol. 3, September 1987.Google ScholarGoogle ScholarCross RefCross Ref
  5. 5.B. J. C. L. Wey and G. M. Wierzba, "Built-in self-test (bist) design of large-scale analog circuit networks," in ISCAS, 1989.Google ScholarGoogle Scholar
  6. 6.J. L. Huertas, A. Rueda, and D. Vazquez, "Improving the testability of switched capacitor filters," Analog Integrated Circuits and Signal Processing, vol. 4, pp. 199-213, 1993. Kluwer Academic Publishers. Google ScholarGoogle ScholarDigital LibraryDigital Library
  7. 7.L. T. Wurtz, "Built-in self-test structure for mixed-mode circuits," IEEE Transactions on Instrumentation and Measurement, vol. 42, February 1993.Google ScholarGoogle ScholarCross RefCross Ref
  8. 8.L. Milor and V. Visvanathan, "Detection of catastrophic faults in analog integrated circuits," in ICCAD, February 1989.Google ScholarGoogle Scholar
  9. 9.V. Kolarik, M. Lubaszewski, and B. Courtois, "Towards selfchecking mixed-signal integrated circuits," in European Solid- State Circuits Conference, 1993.Google ScholarGoogle Scholar
  10. 10.V. Kolarik, M. Lubaszewski, and B. Courtois, "Designing selfexcersising analogue checkers," in IEEE VLSI Test Symposium, 1994.Google ScholarGoogle Scholar
  11. 11.K. C. Hsieh, P. R. Gray, D. Senderowicz, and D. C. Messerschmidt, "A low-noise chopper-stabilized switched-capacitor filtering technique," IEEE Journal of Solid-State Circuits, vol. SC-16, pp. 708-715, December 1981.Google ScholarGoogle Scholar
  12. 12.R. Gregorian and G. Temes, Analog MOS Integrated Circuits for Signal Processing. Wiley and Sons, 1986.Google ScholarGoogle Scholar

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        cover image ACM Conferences
        DAC '95: Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
        January 1995
        760 pages
        ISBN:0897917251
        DOI:10.1145/217474

        Copyright © 1995 ACM

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        • Published: 1 January 1995

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