Abstract
Maximum operating frequency (Fmax) of a system often needs to be determined at multiple operating points, defined by voltage and temperatures. Such calibration is important for the speed binning process, where the voltage-frequency (V-Fmax) relation needs to be accurately determined to sort chips into different bins that can be used for different applications. Moreover, adaptive systems typically require Fmax calibration at multiple operating points in order to dynamically change operating condition such as supply voltage or body bias for power, temperature, or throughput management. For example, a Dynamic Voltage and Frequency Scaling (DVFS) system requires accurate delay calibration at multiple operating voltages in order to apply the correct operating frequency corresponding to a scaled supply. In this article, we propose a low-overhead design technique that allows efficient characterization of Fmax at different operating voltages and temperatures. The proposed method selects a set of representative timing paths in a circuit based on their temperature and voltage sensitivities and dynamically configures them into a ring oscillator to compute the critical path delay. Compared to existing Fmax calibration approaches, the proposed approach provides the following two main advantages: (1) it introduces a delay sensitivity metric to isolate few representative timing paths; (2) it considers actual timing paths instead of critical path replicas, thereby accounting for local within-die delay variations. The all-digital calibration method is robust under process variations and achieves high delay estimation accuracy (> 4% error) at the cost of negligible design overhead (1.7% in delay, 0.3% in power, and 3.5% in die-area).
- Azizi, N., Khellah, M. M., De, V., and Najm, F. N. 2005. Variations-Aware low power design with voltage scaling. In Proceedings of the 42nd Annual ACM IEEE Design Automation Conference. 529--534. Google ScholarDigital Library
- Borkar, S., Kamik, T., Narendra, S., Tschanz, J., Keshavarzi, A., and De, V. 2003. Parameter variations and impact on circuits and micro architecture. In Proceedings of the 40th Annual ACM IEEE Design Automation Conference. 338--342. Google ScholarDigital Library
- Bushnell, M. L. and Agrawal, V. D. 2000. Essentials of Electronic Testing for Digital, Memory, and Mixed-Signal VLSI Circuits. Springer.Google Scholar
- Chan, A. and Roberts, G. 2001. A synthesizable, fast and high-resolution timing measurement device using a component-invariant vernier delay line. In Proceedings of the International Test Conference. Google ScholarDigital Library
- Cory, B., Kapur, R., and Underwood, B. 2003. Speed binning with path delay test in 150-nm technology. IEEE Des. Test Comput. 20, 5, 41--45. Google ScholarDigital Library
- Daga, J. M. and Auvergne, D. 1998. Temperature effect on delay for low voltage application. In Proceedings of the Design, Automation and Test in Europe Conference. Google ScholarDigital Library
- Ghosh, S., Bhunia, S., and Roy, K. 2006. A new paradigm for low-power, variation tolerant circuit synthesis using critical path isolation. In Proceedings of the International Conference on Computer-Aided Design. Google ScholarDigital Library
- Ha, P., Mule, T., and Meindl, J. D. 1999. Characterization and modeling of clock skew with process variations. In Proceedings of the IEEE Conference on Custom Integrated Circuits. 441--444.Google Scholar
- Hachiya, K., Ohshima, T., Hidenari, Nakashima, Soda, M., and Goto, S. 2007. Fast methods to estimate clock jitter due to power supply noise. IEICE Trans. Fundam. Electron. Comm. Comput. Sci. 90, 4, 741--747. Google ScholarDigital Library
- Huisman, L. 1998. Correlations between path delays and the accuracy of performance prediction. In Proceedings of the International Test Conference. Google ScholarDigital Library
- Karl, E. et al. 2008. Compact in-situ sensors for monitoring negative-bias-temperature-instability effect and oxide degradation. In Proceedings of the International Solid-State Circuits Conference.Google Scholar
- Keane, J., Kim, T.-H., and Kim, C. H. 2007. An on-chip NBTI sensor for measuring pmos threshold voltage degradation. In Proceedings of the IEEE International Symposium on Low Power Electronics and Design. 189--194. Google ScholarDigital Library
- Lasbouygues, B., Wilson, R., Azemard, N., and Maurine, P. 2007. Temperature and voltage aware timing analysis. IEEE Trans. Comput.-Aided Des. Integr. Circ. Syst. 26, 4, 801--815. Google ScholarDigital Library
- Lee, J., Walker, D. M. H., Milor, L., Peng, Y., and Hill, G. 1999. IC performance prediction for test cost-reduction. In Proceedings of the IEEE International Symposium on Semiconductor Manufacturing.Google Scholar
- McGowen, R. Poirier, C. A., Bostak, C., Ignowski, J., Millican, M., Parks, W. H., and Naffziger, S. 2006. Power and temperature control on a 90-nm itanium family processor. IEEE J. Solid State Circ. 41, 1, 229--237.Google ScholarCross Ref
- Ndai, P., Bhunia, S., Agarwal, A., and Roy, K. 2008. Within-Die variation-aware scheduling in superscalar processors for improved throughput. IEEE Trans. Comput. 57, 7, 940--951. Google ScholarDigital Library
- Pateras, S. 2003. Achieving at-speed structural test. IEEE Des. Test Comput. 20, 5, 26--33. Google ScholarDigital Library
- Sakurai, T. and Newton, A. 1990. Alpha-Power law mosfet model and its applications to cmos inverter delay and other formulas. IEEE J. Solid State Circ. 25, 2, 584--594.Google ScholarCross Ref
- Su, C., Chen, Y.-T., Huang, M.-J., Chen, G.-N., and Lee, C.-L. 2000. All digital built-in delay and crosstalk measurement for on-chip buses. In Proceedings of the Design, Automation and Test in Europe Conference. Google ScholarDigital Library
- Tschanz, J., Kao, J. T., Narendra, S. G., Nair, R., Antoniadis, D. A., Chandrakasan, A. P., and De, V. 2002. Adaptive body bias for reducing impacts of die-to-die and with parameter variations on microprocessor frequency and leakage. IEEE J. Solid State Circ. 37, 1396--1402.Google ScholarCross Ref
- Tschanz, J., Bowman, K., and De, V. 2005. Variation-Tolerant circuits: Circuit solutions and techniques. In Proceedings of the Design Automation Conference. Google ScholarDigital Library
- Zeng, J., Abadir, M., Kolhatkar, A., Vandling, G., Wang, L., and Abraham, J. 2004. On correlating structural tests with functional tests for speed binning of high performance design. In Proceedings of the International Test Conference. 31--37. Google ScholarDigital Library
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